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    Optical sensors and systems


    LISE System
    Distance / thickness metrology


    NIXUS System
    Fiber optics extensometers


    SKIN VIEW
    Optical coherence tomography

    T-MAP System
    Wafer thickness



    Position measurements


    > Absolute distance between the sensor and a surface, from a few tenth of microns to more than 10 meters.
    > Positioning, real time deformation measurement, level measurement (molten glass or metal).

    Example:
    - Measurement of the level of molten glass at 1600°C
    - Positioning of a telescope mirror


    Thickness measurements

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    > From 10 microns to several hundreds of millimeters.
    > Translucent materials: direct or indAirect measurement (a patented method particularly efficient for in-line measurements).
    > Thickness measurement of flat products using an optical fork sensor.

    Example:
    - In-line control of television screens
    - Thickness control of watch glasses during the polishing operation
    - Real time control of quartz or silicon wafers during the etching process.

    Localisation of interfaces


    > Positioning of elements along the measurement axis.
    > Localisation of interfaces in guided optics.

    Example:
    - Control of the position of lenses in precision optical systems.

    Analysis of internal structure of diffusing materials (tomography)



    > Composite materials
    > Biological tissues